Engineering documentation for UV lamp replacement
Application notes, spec guides, and cross-reference criteria — written for production engineers, not purchasing catalogues.
Why wattage alone fails the replacement test
Spectral peak wavelength, irradiance uniformity, and base geometry each constrain compatibility independently. A lamp rated at identical wattage can still produce the wrong cure depth if its emission peak drifts by 15 nm.
This guide documents the three-parameter matching method XLEAD uses across PCB exposure and UV curing applications — with worked cross-reference examples.
Covers: spectral peak tolerance, base geometry codes, irradiance decay curves. Format: engineering note with spec tables.
Spec references by application
Spectral matching for photoresist systems
Irradiance uniformity across cure width
Base geometry and fit codes explained
Pin-type codes, electrode spacing tolerances, and mechanical fit verification for high-speed rotary press lamp replacement without press modification.
Peak wavelength tolerance, collimation requirements, and lamp aging curves for dry-film and liquid photoresist exposure lines.
How reflector geometry and lamp arc length interact with conveyor speed to determine effective dose — and which parameters trigger under-cure.
Have a lamp to match? Send us the spec.
Submit your existing lamp's part number or a photo — our engineers verify photometric and mechanical compatibility before quoting.